Thin film Measurement of Anti-Reflection Coatings on Solar Cells
The modern diode-array technology provides a fast and effective in-line measure of the reflectance and the color of the anti-reflection coating on solar cells. This information enables process optimization and color sorting. Furthermore, with the index of refraction, the software can precisely calculate the layer thickness. This application was created in a joint venture with Vitronic and won the CellAward in 2009.